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SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - San Diego, California (Sunday 11 March 2012)] Active and Passive Smart Structures and Integrated Systems 2012 - Integrated framework for jitter analysis combining disturbance, structure, vibration isolator and optical model
Lee, Dae-Oen, Yoon, Jae-San, Han, Jae-Hung, Sodano, Henry A.Volume:
8341
Année:
2012
Langue:
english
Pages:
1
DOI:
10.1117/12.915428
Fichier:
PDF, 2.95 MB
english, 2012