A Fully Three-Dimensional Atomistic Quantum Mechanical Study on Random Dopant-Induced Effects in 25-nm MOSFETs
Xiang-Wei Jiang, Hui-Xiong Deng, Jun-Wei Luo, Shu-Shen Li, Lin-Wang WangVolume:
55
Année:
2008
Langue:
english
Pages:
7
DOI:
10.1109/ted.2008.925331
Fichier:
PDF, 619 KB
english, 2008