Reliability Mechanisms of LTPS-TFT With Gate Dielectric: PBTI, NBTI, and Hot-Carrier Stress
Ming-Wen Ma, Chih-Yang Chen, Woei-Cherng Wu, Chun-Jung Su, Kuo-Hsing Kao, Tien-Sheng Chao, Tan-Fu LeiVolume:
55
Année:
2008
Langue:
english
Pages:
8
DOI:
10.1109/ted.2008.919710
Fichier:
PDF, 1017 KB
english, 2008