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Conduction mechanisms in barium tantalates films and modification of interfacial barrier height
Yun-Hi Lee, Young-Sik Kim, Dong-Ho Kim, Byeong-Kwon Ju, Myung-Hwan OhVolume:
47
Année:
2000
Langue:
english
Pages:
6
DOI:
10.1109/16.817569
Fichier:
PDF, 162 KB
english, 2000