Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
2000 Vol. 168; Iss. 4
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Fluence dependence of the interband critical points in ion-implanted silicon
M.A El-Sherbiny, H.H El-Bahnasawy, M.M El-OckerVolume:
168
Année:
2000
Langue:
english
Pages:
11
DOI:
10.1016/s0168-583x(00)00067-7
Fichier:
PDF, 518 KB
english, 2000