Structural study of thin films by extended energyloss fine structure spectroscopy
M. De Crescenzi, N. Motta, L. Lozzi, M. Passacantando, P. Picozzi, S. SantucciVolume:
193-194
Année:
1990
Langue:
english
Pages:
16
DOI:
10.1016/s0040-6090(05)80038-0
Fichier:
PDF, 717 KB
english, 1990