
Study of structure and optical properties of silver oxide films by ellipsometry, XRD and XPS methods
Xiao-Yong Gao, Song-You Wang, Jing Li, Yu-Xiang Zheng, Rong-Jun Zhang, Peng Zhou, Yue-Mei Yang, Liang-Yao ChenVolume:
455-456
Année:
2004
Langue:
english
Pages:
5
DOI:
10.1016/j.tsf.2003.11.242
Fichier:
PDF, 156 KB
english, 2004