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Investigations on electrical characteristics and reliability properties of MOS capacitors using HfAlOx on n-GaAs substrates
P.S. Das, Abhijit BiswasVolume:
52
Année:
2012
Langue:
english
Pages:
6
DOI:
10.1016/j.microrel.2011.08.005
Fichier:
PDF, 620 KB
english, 2012