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Method to deduce the critical size for interfacial delamination of patterned electrode structures and application to lithiation of thin-film silicon islands
Hamed Haftbaradaran, Xingcheng Xiao, Mark W. Verbrugge, Huajian GaoVolume:
206
Année:
2012
Langue:
english
Pages:
10
DOI:
10.1016/j.jpowsour.2012.01.097
Fichier:
PDF, 1.41 MB
english, 2012