Goodness-of-fit using very small but related samples with application to censored data estimation of PCB contamination
Richard A. Johnson, D. Robert Gan, P. M. BerthouexVolume:
6
Année:
1995
Langue:
english
Pages:
8
DOI:
10.1002/env.3170060403
Fichier:
PDF, 460 KB
english, 1995