Temperature dependence of minority hole mobility in n+-GaAs measured with a new variable temperature technique
Michael L. Lovejoy, Michael R. Melloch, Mark S. Lundstrom, Brian R. Keyes, Richard K. AhrenkielVolume:
23
Langue:
english
Pages:
5
DOI:
10.1007/bf02653354
Date:
July, 1994
Fichier:
PDF, 534 KB
english, 1994