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Growth, morphological and structural characterization of silicon carbide epilayers for power electronic devices applications
C. F. Pirri, S. Porro, S. Ferrero, E. Celasco, S. Guastella, L. Scaltrito, R. Yakimova, M. Syväjärvi, R. R. Ciechonski, S. De Angelis, D. CrippaVolume:
40
Année:
2005
Langue:
english
Pages:
3
DOI:
10.1002/crat.200410468
Fichier:
PDF, 387 KB
english, 2005