Reverse DC bias stress shifts in organic thin-film transistors with gate dielectrics using parylene-C
Kenjiro Fukuda, Tatsuya Suzuki, Daisuke Kumaki, Shizuo TokitoVolume:
aop
Année:
2012
Langue:
english
Pages:
1
DOI:
10.1002/pssa.201228219
Fichier:
PDF, 689 KB
english, 2012