[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Excellent resistance switching characteristics of Pt/SrTiO/sub 3/ schottky junction for multi-bit nonvolatile memory application
Hyunjun Sim,, Hyejung Choi,, Dongsoo Lee,, Man Chang,, Dooho Choi,, Yunik Son,, Eun-Hong Lee,, Wonjoo Kim,, Yoondong Park,, In-Kyeong Yoo,, Hyunsang Hwang,Année:
2005
Langue:
english
Pages:
4
DOI:
10.1109/iedm.2005.1609464
Fichier:
PDF, 747 KB
english, 2005