[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - Empirical Characteristics and Extraction of Overall Variations for 65-nm MOSFETs and Beyond
Kanno, Michihiro, Shibuya, Akira, Matsumura, Masao, Tamura, Kazuhiro, Tsuno, Hitoshi, Mori, Shigetaka, Fukuzaki, Yuzo, Gocho, Tetsuo, Ansai, Hisahiro, Nagashima, NaokiAnnée:
2007
Langue:
english
Pages:
2
DOI:
10.1109/vlsit.2007.4339738
Fichier:
PDF, 717 KB
english, 2007