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[IEEE 1998 High-Temperature Electronic Materials, Devices and Sensors Conference - San Diego, CA, USA (22-27 Feb. 1998)] 1998 High-Temperature Electronic Materials, Devices and Sensors Conference (Cat. No.98EX132) - Electrical conductivity of ceramics of SiC-AlN, SiC-BeO, Al/sub 2/O/sub 3/ in the temperature range 300-1800 K
Avrov, D.D., Bakin, A.S., Dorozhkin, S.I., Rastegaev, V.P., Tairov, Yu.M., Bilalov, B.A., Safaraliev, G.K., Shabanov, S.A., Lebedev, A.O.Année:
1998
Langue:
english
Pages:
3
DOI:
10.1109/htemds.1998.730697
Fichier:
PDF, 202 KB
english, 1998