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Effect of electric fields on the dynamics of silicon microhardness changes induced by low-intensity β irradiation
A. A. Dmitrievskii, Yu. I. Golovin, V. M. Vasyukov, N. Yu. SuchkovaVolume:
72
Langue:
english
Pages:
3
DOI:
10.3103/s1062873808070149
Date:
July, 2008
Fichier:
PDF, 127 KB
english, 2008