Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2010 / 10 Vol. 4; Iss. 5
Use of cluster secondary ions for minimization of matrix effects in the SIMS depth profiling of La/B4C multilayer nanostructures
M. N. Drozdov, Yu. N. Drozdov, M. M. Barysheva, V. N. Polkovnikov, N. I. ChkhaloVolume:
4
Langue:
english
Pages:
4
DOI:
10.1134/s1027451010050216
Date:
October, 2010
Fichier:
PDF, 307 KB
english, 2010