Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2010 / 02 Vol. 4; Iss. 1
Study of thin Ge films with amorphous and nanocrystalline phases via the techniques of EXAFS spectroscopy and AFM
R. G. Valeev, A. N. Deev, D. V. Surnin, V. V. Kriventsov, O. V. Karban, V. M. Vetoshkin, O. I. PivovarovaVolume:
4
Langue:
english
Pages:
6
DOI:
10.1134/s1027451010010209
Date:
February, 2010
Fichier:
PDF, 300 KB
english, 2010