Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2007 / 02 Vol. 1; Iss. 1
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Synchrotron investigations of the electron structure of silicon nanocrystals in a SiO2matrix
V. A. Terekhov, S. Yu. Turishchev, V. M. Kashkarov, E. P. Domashevskaya, A. N. Mikhailov, D. I. Tetel’baumVolume:
1
Langue:
english
Pages:
5
DOI:
10.1134/s1027451007010107
Date:
February, 2007
Fichier:
PDF, 179 KB
english, 2007