56

X-ray nanobeam diffraction imaging of materials

Année:
2018
Langue:
english
Fichier:
PDF, 2.30 MB
english, 2018
67

Free log-likelihood as an unbiased metric for coherent diffraction imaging

Année:
2020
Langue:
english
Fichier:
PDF, 2.55 MB
english, 2020