R. W. E. van de Kruijs : rechercher sur Z-Library

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51

A Facile Microwave-Mediated Drying Process of Thermally Unstable / Labile Products

Pinchukova, N. A., Voloshko, A. Yu., Shyshkin, O. V., Chebanov, V. A., Van de Kruijs, B. H. P., Arts, J. C. L., Dressen, M. H. C. L., Meuldijk, J., Vekemans, J. A. J. M., Hulshof, L. A.

Journal:

Organic Process Research & Development

Année:

2010

Langue:

english

Fichier:

PDF, 2.40 MB

english, 2010

52

Variable Microwave Effects in the Synthesis of Ureidopyrimidinones: the Role of Heterogeneity

Dressen, Mark H. C. L., van de Kruijs, Bastiaan H. P., Meuldijk, Jan, Vekemans, Jef A. J. M., Hulshof, Lumbertus A.

Journal:

Organic Process Research & Development

Année:

2011

Langue:

english

Fichier:

PDF, 555 KB

english, 2011

53

Vanishing Microwave Effects: Influence of Heterogeneity

Dressen, Mark H. C. L., Kruijs, Bastiaan H. P. van de, Meuldijk, Jan, Vekemans, Jef A. J. M., Hulshof, Lumbertus A.

Journal:

Organic Process Research & Development

Année:

2007

Langue:

english

Fichier:

PDF, 742 KB

english, 2007

54

Model independent x-ray standing wave analysis of periodic multilayer structures

Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Chuev, M. A., Pashaev, E. M., Zoethout, E., Louis, E., Seregin, S. Yu., Subbotin, I. A., Novikov, D. V., Bijkerk, F., Kovalchuk, M. V.

Journal:

Journal of Applied Physics

Année:

2014

Langue:

english

Fichier:

PDF, 1.38 MB

english, 2014

55

studied by polarized neutron reflectometry

van de Kruijs, R. W. E., Rekveldt, M. Th., Fredrikze, H., Kohlhepp, J. T., Ha, J. K., de Jonge, W. J. M.

Journal:

Physical Review B

Année:

2002

Langue:

english

Fichier:

PDF, 98 KB

english, 2002

56

A Novel Production Route for Nylon-6: Aspects of Microwave-Enhanced Catalysis

Meuldijk, J., van de Kruijs, B.H.P., van Vekemans, J.A.J.M., Hulshof, L.A., Duchateau, R., Koning, C.E.

Journal:

Macromolecular Symposia

Année:

2011

Langue:

english

Fichier:

PDF, 252 KB

english, 2011

57

multilayers

Nedelcu, I., van de Kruijs, R. W. E., Yakshin, A. E., Bijkerk, F.

Journal:

Physical Review B

Année:

2007

Langue:

english

Fichier:

PDF, 283 KB

english, 2007

58

In-depth agglomeration of d-metals at Si-on-Mo interfaces

Tsarfati, Tim, Zoethout, Erwin, van de Kruijs, Robbert, Bijkerk, Fred

Journal:

Journal of Applied Physics

Année:

2009

Langue:

english

Fichier:

PDF, 570 KB

english, 2009

59

Ion assisted growth of B4C diffusion barrier layers in Mo/Si multilayered structures

Bruijn, S., van de Kruijs, R. W. E, Yakshin, A. E., Bijkerk, F.

Journal:

Journal of Applied Physics

Année:

2012

Langue:

english

Fichier:

PDF, 526 KB

english, 2012

60

Chemical interaction of B[sub 4]C, B, and C with Mo/Si layered structures

de Rooij-Lohmann, V. I. T. A., Veldhuizen, L. W., Zoethout, E., Yakshin, A. E., van de Kruijs, R. W. E., Thijsse, B. J., Gorgoi, M., Schäfers, F., Bijkerk, F.

Journal:

Journal of Applied Physics

Année:

2010

Langue:

english

Fichier:

PDF, 433 KB

english, 2010

61

Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B[sub 4]C/Si layered systems

de Rooij-Lohmann, V. I. T. A., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E., Kleyn, A. W., Keim, E. G., Gorgoi, M., Schäfers, F., Brongersma, H. H., Bijkerk, F.

Journal:

Journal of Applied Physics

Année:

2010

Langue:

english

Fichier:

PDF, 693 KB

english, 2010

62

Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry

Chen, Juequan, Louis, Eric, Wormeester, Herbert, Harmsen, Rob, van de Kruijs, Robbert, Lee, Chris J, van Schaik, Willem, Bijkerk, Fred

Journal:

Measurement Science and Technology

Année:

2011

Langue:

english

Fichier:

PDF, 426 KB

english, 2011

63

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Advances in X-Ray/EUV Optics and Components VIII - Suppression of long wavelength reflection from extreme-UV multilayer optics

Huang, Q., van den Boogaard, A. J. R., van de Kruijs, R., Zoethout, E., Medvedev, V. V., Louis, E., Bijkerk, F., Khounsary, Ali, Goto, Shunji, Morawe, Christian

Année:

2013

Langue:

english

Fichier:

PDF, 299 KB

english, 2013

64

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Emerging Lithographic Technologies VII - Stress mitigation in Mo/Si multilayers for EUV lithography

Zoethout, Erwin, Sipos, G., van de Kruijs, R. W., Yakshin, Andrey E., Louis, Eric, Muellender, Stefan, Bijkerk, Fred, Engelstad, Roxann L.

Année:

2003

Langue:

english

Fichier:

PDF, 176 KB

english, 2003

65

SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 13 April 2015)] EUV and X-ray Optics: Synergy between Laboratory and Space IV - Characterization of nanoscale multilayer structures upon thermal annealing

Hudec, René, Pina, Ladislav, Makhotkin, I. A., Zameshin, A., van de Kruijs, R. W. E., Yakshin, A., Bijkerk, F.

Année:

2015

Langue:

english

Fichier:

PDF, 270 KB

english, 2015

66

Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources

Sobierajski, Ryszard, Loch, Rolf Antonie, van de Kruijs, Robbert W. E., Louis, Eric, von Blanckenhagen, Gisela, Gullikson, Eric M., Siewert, Frank, Wawro, Andrzej, Bijkerk, Fred

Journal:

Journal of Synchrotron Radiation

Année:

2013

Langue:

english

Fichier:

PDF, 924 KB

english, 2013

67

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Advances in X-Ray/EUV Optics and Components VIII - Optimization of LaN/B multilayer mirrors for 6.x nm wavelength

Makhotkin, I. A., van de Kruijs, R. W. E., Zoethout, E., Louis, E., Bijkerk, F., Khounsary, Ali, Goto, Shunji, Morawe, Christian

Année:

2013

Langue:

english

Fichier:

PDF, 448 KB

english, 2013

68

Determination of oxygen diffusion kinetics during thin film ruthenium oxidation

Coloma Ribera, R., van de Kruijs, R. W. E., Yakshin, A. E., Bijkerk, F.

Journal:

Journal of Applied Physics

Année:

2015

Langue:

english

Fichier:

PDF, 1.22 MB

english, 2015

69

High-reflectance La/B-based multilayer mirror for 6x nm wavelength

Kuznetsov, D. S., Yakshin, A. E., Sturm, J. M., van de Kruijs, R. W. E., Louis, E., Bijkerk, F.

Journal:

Année:

2015

Langue:

english

Fichier:

PDF, 1.36 MB

english, 2015

70

Phosphorus-based compounds for EUV multilayer optics materials

Medvedev, V.V., Yakshin, A.E., van de Kruijs, R.W.E., Bijkerk, F.

Journal:

Optical Materials Express

Année:

2015

Langue:

english

Fichier:

PDF, 910 KB

english, 2015

71

Structural properties of subnanometer thick Y layers in extreme ultraviolet multilayer mirrors

Bosgra, Jeroen, Zoethout, Erwin, van der Eerden, Ad M. J., Verhoeven, Jan, van de Kruijs, Robbert W. E., Yakshin, Andrey E., Bijkerk, Fred

Journal:

Année:

2012

Langue:

english

Fichier:

PDF, 429 KB

english, 2012

72

Short period La/B and LaN/B multilayer mirrors for ~68 nm wavelength

Makhotkin, Igor A., Zoethout, Erwin, van de Kruijs, Robbert, Yakunin, Sergey N., Louis, Eric, Yakunin, A. M., Banine, V., Müllender, S., Bijkerk, Fred

Journal:

Année:

2013

Langue:

english

Fichier:

PDF, 1.06 MB

english, 2013

73

Subwavelength single layer absorption resonance antireflection coatings

Huber, S.P., van de Kruijs, R.W.E., Yakshin, A.E., Zoethout, E., Boller, K.-J., Bijkerk, F.

Journal:

Année:

2014

Langue:

english

Fichier:

PDF, 10.88 MB

english, 2014

74

Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structures

Yakunin, S. N., Makhotkin, I. A., Nikolaev, K. V., van de Kruijs, R. W. E., Chuev, M. A., Bijkerk, F.

Journal:

Année:

2014

Langue:

english

Fichier:

PDF, 878 KB

english, 2014

75

Infrared antireflective filtering for extreme ultraviolet multilayer Bragg reflectors

Medvedev, V. V., Yakshin, A. E., van de Kruijs, R. W. E., Krivtsun, V. M., Yakunin, A. M., Koshelev, K. N., Bijkerk, F.

Journal:

Année:

2012

Langue:

english

Fichier:

PDF, 294 KB

english, 2012

76

UV spectral filtering by surface structured multilayer mirrors

Q. Huang, D. M. Paardekooper, E. Zoethout, V. V. Medvedev, R. Van De Kruijs, J. Bosgra, E. Louis, F. Bijkerk

Année:

2014

Langue:

english

Fichier:

PDF, 472 KB

english, 2014

77

[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - Surface oxide content examination of capping boron layers in UV photodetectors

Mohammadi, V., Rao, P.R., van de Kruijs, R.W.E., Nihtianov, S.

Année:

2015

Langue:

english

Fichier:

PDF, 752 KB

english, 2015

78

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Emerging Lithographic Technologies XI - Enhanced reflectance of interface engineered Mo/Si multilayers produced by thermal particle deposition

Yakshin, A. E., van de Kruijs, R. W. E., Nedelcu, I., Zoethout, E., Louis, E., Bijkerk, F., Enkisch, H., Müllender, S., Lercel, Michael J.

Année:

2007

Langue:

english

Fichier:

PDF, 231 KB

english, 2007

79

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Advances in X-Ray/EUV Optics and Components X - High-reflectance La/B-based multilayer mirror for 6.x-nm wavelength

Goto, Shunji, Morawe, Christian, Khounsary, Ali M., Kuznetsov, Dmitry, Yakshin, Andrey, Sturm, Marko, van de Kruijs, Robbert, Louis, Eric, Bijkerk, Fred

Année:

2015

Langue:

english

Fichier:

PDF, 1.82 MB

english, 2015

80

[IEEE 2015 9th International Conference on Sensing Technology (ICST) - Auckland, New Zealand (2015.12.8-2015.12.10)] 2015 9th International Conference on Sensing Technology (ICST) - Influence of the surface oxide content of a boron capping layer on UV photodetector performance

Mohammadi, V., van de Kruijs, R.W.E., Rao, P.R., Sturm, J.M., Nihtianov, S.

Année:

2015

Langue:

english

Fichier:

PDF, 1.10 MB

english, 2015

81

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Optics for EUV, X-Ray, and Gamma-Ray Astronomy II - Enhanced performance of EUV multilayer coatings

Louis, E., Citterio, Oberto, O'Dell, Stephen L., Yakshin, A. E., Zoethout, E., van de Kruijs, R. W. E., Nedelcu, I., van der Westen, S. A., Tsarfati, T., Bijkerk, F., Enkisch, H., Müllender, S., Wolsc

Année:

2005

Langue:

english

Fichier:

PDF, 163 KB

english, 2005

82

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Advances in X-Ray/EUV Optics and Components VI - Interface diffusion kinetics and lifetime scaling in multilayer Bragg optics

van de Kruijs, R. W. E., Morawe, Christian, Khounsary, Ali M., Bruijn, S., Yakshin, A., Goto, Shunji, Nedelcu, I., Bijkerk, F.

Année:

2011

Langue:

english

Fichier:

PDF, 851 KB

english, 2011

83

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Emerging Lithographic Technologies IX - Multilayer coatings for the EUVL process development tool

Louis, E., Mackay, R. Scott, Zoethout, E., van de Kruijs, R. W. E., Nedelcu, I., Yakshin, A. E., van der Westen, S. A., Tsarfati, T., Bijkerk, F., Enkisch, H., Muellender, S.

Année:

2005

Langue:

english

Fichier:

PDF, 138 KB

english, 2005

84

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Emerging Lithographic Technologies VIII - Subatomic accuracy in EUVL multilayer coatings

Zoethout, Erwin, Mackay, R. Scott, Suter, P., van de Kruijs, R. W., Yakshin, Andrey E., Louis, Eric, Bijkerk, Fred, Enkisch, H., Muellender, Stefan

Année:

2004

Langue:

english

Fichier:

PDF, 63 KB

english, 2004

85

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Emerging Lithographic Technologies XI - Substrate recovery layers for EUVL optics: effects on multilayer reflectivity and surface roughness

Nedelcu, I., Lercel, Michael J., van de Kruijs, R. W. E., Yakshin, A. E., Louis, E., Bijkerk, F., Mullender, S.

Année:

2007

Langue:

english

Fichier:

PDF, 345 KB

english, 2007

86

PEALD AlN: Controlling growth and film crystallinity

Banerjee, Sourish, Aarnink, Antonius A. I., van de Kruijs, Robbert, Kovalgin, Alexey Y., Schmitz, Jurriaan

Journal:

Physica status solidi

Année:

2015

Langue:

english

Fichier:

PDF, 762 KB

english, 2015

87

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 22 February 2009)] Alternative Lithographic Technologies - Improved contrast and reflectivity of multilayer reflective optics for wavelengths beyond the extreme UV

Tsarfati, Tim, Schellenberg, Frank M., La Fontaine, Bruno M., Zoethout, Erwin, Louis, Eric, van de Kruijs, Robbert, Yakshin, Andrey, Müllender, Stephan, Bijkerk, Fred

Année:

2009

Langue:

english

Fichier:

PDF, 301 KB

english, 2009

88

SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 18 April 2011)] Damage to VUV, EUV, and X-ray Optics III - Blistering behavior in Mo/Si multilayers

Kuznetsov, A. S., Juha, Libor, Bajt, Saša, Gleeson, M. A., van de Kruijs, R. W. E., London, Richard A., Bijkerk, F.

Année:

2011

Langue:

english

Fichier:

PDF, 596 KB

english, 2011

89

Oxygen-stabilized triangular defects in hexagonal boron nitride

Huber, S. P., Gullikson, E., van de Kruijs, R. W. E., Bijkerk, F., Prendergast, D.

Journal:

Physical Review B

Année:

2015

Langue:

english

Fichier:

PDF, 1.21 MB

english, 2015

90

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Advances in X-Ray/EUV Optics and Components VIII - Engineering optical constants for broadband single layer antireflection coatings

Huber, S. P., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., Bijkerk, F., Khounsary, Ali, Goto, Shunji, Morawe, Christian

Année:

2013

Langue:

english

Fichier:

PDF, 145 KB

english, 2013

91

Reconstruction of interfaces of periodic multilayers from X-ray reflectivity using a free-form approach

Zameshin, Andrey, Makhotkin, Igor A., Yakunin, Sergey N., van de Kruijs, Robbert W. E., Yakshin, Andrey E., Bijkerk, Fred

Journal:

Journal of Applied Crystallography

Année:

2016

Langue:

english

Fichier:

PDF, 1.29 MB

english, 2016

92

Self-healing in B 12 P 2 through Mediated Defect Recombination

Huber, S. P., Gullikson, E., Frye, C. D., Edgar, J. H., van de Kruijs, R. W. E., Bijkerk, F., Prendergast, D.

Journal:

Chemistry of Materials

Année:

2016

Langue:

english

Fichier:

PDF, 7.78 MB

english, 2016

93

Emissivity of freestanding membranes with thin metal coatings

van Zwol, P. J., Vles, D. F., Voorthuijzen, W. P., Péter, M., Vermeulen, H., van der Zande, W. J., Sturm, J. M., van de Kruijs, R. W. E., Bijkerk, F.

Journal:

Journal of Applied Physics

Année:

2015

Langue:

english

Fichier:

PDF, 1.35 MB

english, 2015

94

Determining crystal phase purity in c-BP through X-ray absorption spectroscopy

Huber, S. P., Medvedev, V. V., Gullikson, E., Padavala, B., Edgar, J. H., van de Kruijs, R. W. E., Bijkerk, F., Prendergast, D.

Journal:

Physical Chemistry Chemical Physics

Année:

2017

Langue:

english

Fichier:

PDF, 4.74 MB

english, 2017

95

Detection of defect populations in superhard semiconductor boron subphosphide B 12 P 2 through X-ray absorption spectroscopy

Huber, S. P., Gullikson, E., Meyer-Ilse, J., Frye, C. D., Edgar, J. H., van de Kruijs, R. W. E., Bijkerk, F., Prendergast, D.

Journal:

Journal of Materials Chemistry A

Année:

2017

Langue:

english

Fichier:

PDF, 2.90 MB

english, 2017

96

Intermixing and thermal oxidation of ZrO 2 thin films grown on a-Si, SiN, and SiO 2 by metallic and oxidic mode magnetron sputtering

Coloma Ribera, R., van de Kruijs, R. W. E., Sturm, J. M., Yakshin, A. E., Bijkerk, F.

Journal:

Journal of Applied Physics

Année:

2017

Langue:

english

Fichier:

PDF, 2.91 MB

english, 2017

97

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Extreme Ultraviolet (EUV) Lithography VIII - Reducing EUV mask 3D effects by alternative metal absorbers

Panning, Eric M., Goldberg, Kenneth A., Philipsen, Vicky, Luong, Kim Vu, Souriau, Laurent, Hendrickx, Eric, Erdmann, Andreas, Xu, Dongbo, Evanschitzky, Peter, van de Kruijs, Robbert W. E., Edrisi, Ara

Année:

2017

Langue:

english

Fichier:

PDF, 1.42 MB

english, 2017

98

Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics

Huang, Qiushi, Medvedev, Viacheslav, van de Kruijs, Robbert, Yakshin, Andrey, Louis, Eric, Bijkerk, Fred

Journal:

Applied Physics Reviews

Année:

2017

Langue:

english

Fichier:

PDF, 2.25 MB

english, 2017

99

Structure of high-reflectance La/B-based multilayer mirrors with partial La nitridation

Kuznetsov, D. S., Yakshin, A. E., Sturm, J. M., van de Kruijs, R. W. E., Bijkerk, F.

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 3.02 MB

english, 2016

100

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Emerging Lithographic Technologies X - Multilayer optics with spectral purity layers for the EUV wavelength range

Louis, E., Lercel, Michael J., van de Kruijs, R. W .E., Yakshin, A. E., van der Westen, S. Alonso, Bijkerk, F., van Herpen, M. M. J. W., Klunder, D. J. W., Bakker, L., Enkisch, H., Müllender, S., Rich

Année:

2006

Langue:

english

Fichier:

PDF, 110 KB

english, 2006